ESSIC scientists John Xun Yang, Yalei You, and Ralph Ferraro are co-authors on a new paper in Institute of Electrical and Electronics Engineers (IEEE) that describes a newly developed adaptive window for calibration on microwave sounders at EUMETSAT and NOAA.
Tag: william blackwell
Quantifying and Characterizing Striping of Microwave Humidity Sounder With Observation and Simulation
ESSIC/CISESS scientists John Xun Yang, Yalei You, and Rachael Kroodsma are co-authors on a new paper in IEEE Transactions on Geoscience and Remote Sensing alongside Sidharth Misra from NASA Jet Propulsion Laboratory and William Blackwell from MIT Lincoln Laboratory. Blackwell is also a two-time speaker for the ESSIC Seminar Series, the most recent of which can be viewed here.